000			01438cam a22004817a 4500
001			005735
003			armpuni
005			20160923155442.0
008			160923s2001####xx#a##########000#0#und#d
020			_a0201610914
040			_aarmpuni _carmpuni
041			_aen
080			_a535-34
100	1		_aCullity, B.D.
245	1	0	_aElements of X-Ray diffraction / _cB.D. Cullity, S.R. Stock
250			_a3th. ed.
260			_aNew Jersey : _bPrentice Hall, _cc2001
300			_a664 p.; _c24 cm.
650		7	_acrystal quality _2LEMB
650		7	_acrystal structure _2LEMB
650		7	_adiffraction _2LEMB
650		7	_adiffractometer measurements _2LEMB
650		7	_adifraccion _2LEMB
650		7	_ageometria de cristales _2LEMB
650		7	_ageometry of crystals _2LEMB
650		7	_alaue photographs _2LEMB
650		7	_aolycrystalline aggregates _2LEMB
650		7	_aphase identification _2LEMB
650		7	_aphase _xdiagram determination _2LEMB
650		7	_apolymers _2LEMB
650		7	_apowder photographs _2LEMB
650		7	_aquantitative phase analysis _2LEMB
650		7	_arayos x _2LEMB
650		7	_asingle crystals _2LEMB
650		7	_asmall angle scattering _2LEMB
650		7	_astress measurement _2LEMB
650		7	_atransmission electron microscopy _2LEMB
650		7	_ax _xray diffraction _2LEMB
650		7	_ax _xray _2LEMB
700	1		_aStock, S.R.
942			_cLB _2cdu
945			_aJPA _d2005-03-30
999			_c5734 _d6909